VAI Test Handler
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| THROUGHPUT |  |
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Very High System Throughput | ||
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Fast Index Time | ||
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Quick Changeover | ||
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High First Pass Yield | ||
| - Unique Device Plunging | |||
| - Unique Device Alignment | |||
| USER INTERFACING | |||
| Operation | |||
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Ergonomic Tray Height | ||
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Intuitive Graphical Screen | ||
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Local Language Prompting available | ||
| Maintenance | |||
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Socket in easy reach | ||
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Intuitive Graphical Screen | ||
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Small Footprint | ||